Preparation and Micro-friction Behavior of Rare Earth Composite Film

The composite film of MPTS-RE was prepared on singlecrystal silicon substrate through a self-assembling process. Contact angle and the chemical composition of the film were analyzed by means of contact angle measurements and X-ray photo-electron spectroscopy (XPS). Surface morphology and the tribological properties of the film were evaluated by atomic force microscope (AFM). Results show that the rare earth (RE) is successfully deposited on sulfonated MPTS film. The friction force between the probe and the film increases with the increment of the scanning rate and the load. The adhesion force ascends with the increasing of relative humidity. MPTS-RE composite film has low steady friction coefficient and adhesion force.